Test Capability
From load-pull characterization to modulated-signal measurements
Depending on our customers’ needs we can go through different kind of measurements. As a first step, load-pull characterization of a unitary transistor will allow us to design the specific matching network of the desired amplifier. Then, a full characterization of the designed amplifier can be carried out through 1 tone to modulated signal measurement.
For the development and characterization of our power amplifiers, we have two fully equipped RF laboratories in Limoges and Toulouse, France.
OUR TESTBENCHES
Load-Pull Testbench
For any power amplifier design, the load-pull characterization is an important and essential step. Not only to validate the performance of the nonlinear model, but also to bring precision to our design.
Architected around a vector network analyzer, our load pull bench can be either used under probes, to characterize wafer chips, or on a carrier, to obtain a complete technology characterization. Moreover, this bench can also be used to characterize packaged transistors. For this purpose, Wupatec designs specific test fixtures ensuring measurement precision as well as chip stability.
Both CW and pulsed measurements are possible. An input tuner allows to adjust the Source Impedance seen by the transistor or to perform a source pull measurement. On the output side, our multi-harmonic tuner allows us to control impedances at the fundamental frequency and at the second harmonic. This latter one presents a significant performance influence in GaN transistor technology.
Vectorial 50 Ohms Testbench
To characterize the designed power amplifiers (both in CW and pulsed configurations), we use a 50 Ohm bench based on a vector network analyzer. Through this, we obtain a complete S parameters characterization, paying significant attention to the gain and the Input Return Loss figures.
Then, 1 Tone measurements (frequency & power sweeps) are carried out to obtain the typical performances such as gain, efficiency and power capability in large signal configuration, as well as the AM/AM & AM/PM curves.
Two-tone characterizations are also possible, which provide information on instantaneous bandwidth capabilities.
Modulated Signal 50 Ohms Testbench
Based on ADRV9009 Transceivers or the latest RFSoC ZCU670 from AMD, our scalar test benches can perform both CW and Pulsed RF Signal measurements (Configurable pulse rise/fall timings in pulsed mode).
Allowing 1 or 2 Tones measurements, the aim of these test benches is to characterize the power amplifier linearity performances for 5G modulated signals.
Using the RFSoC as an integrated vector signal generator (VSG) and vector signal analyzer (VSA) we are capable of performing IQ Modulation and Demodulation. This is thanks to the IQSTAR Software from AMCAD that drives all the setup
Our Test benches can offer a flexible choice when selecting the required DPD & CFR algorithms. Commercial DPD can be first used as a reference point. Then an evaluation of the customers DPD can be carried out. Lastly Wupatec has developed its own DPD & CFR algorithms as a reference. The internal development of DPD & CFR algorithms, has enabled us to respond our customers with their specific needs. An example of this is that we are able to adjust our DPD for low latency applications.
OUR SOLUTIONS
Measurement capability that ensures first-pass design success
This provides us with rigorous inputs during the design phase. At Wupatec, we believe this is an essential step to respond to our customers’ needs giving credibility and building confidence. Take a look at our different solutions.
Contact us
+33 05 55 42 62 44
Head Office: 20 rue Atlantis, 87068, Limoges, France